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18" x 1" x ½")
lateral calibration of SPM scanners and detection of any lateral nonlinearity
The structure symmetry makes it possible to calibrate your AFM system in one step without rotating the sample in-between X- and Y-axis calibration
7µm Cantilever C - Soft Tapping Cantilever D - Tapping Mode Shape Beam Shape Beam Force Constant 7
PPP-NCH <20 nm 18" x 1" x ½")DESCRIPTION POINTPROBE PLUS SILICON SPM PROBE SILICON CANTILEVER FOR NON CONTACT TAPPING MODE
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