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All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend
silicone Petri dish covers protect the scanner and prevent evaporation of fluid during scanning
the diamond is mounted with the vertical axis of the tip approximately normal to the sample when mounted on the microscope
This part is included in the Conductive AFM Option
MFMSAMPLE 9 kHz All cantilevers on the sharpenedMagnetic Field Microscopy Sample, on 15mm Puck DESCRIPTION Magnetic Force Microscopy Sample, on 12mm Puck.
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