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SiNi 120mm Electrical Resistance through adhesive: 0

SKU: 6847273258

4.6
EUR202.40 EUR247.40

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Description

Electrical Resistance through adhesive: 0

the supploed sample modulus is nominal and may change with sample aging

Intended to be used with FESEM at higher magnifications

Sapphire discs are made from sapphire rods

SiNi 120mm Electrical Resistance through adhesive: 0Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip This competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge

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