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Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio
Ultra Fine Tips 5 110mm High-Alloy NM-SS 0
Fused Silica 72
5mm) length and 4mm M4 thread
FIB Lift-Out Grids for Inverted Sample Preparation Ted Pella Focused Ion Beam (FIB) probesDESCRIPTION Three post molybdenum grids with an extended rim which allows the grid to be held in an inverted position for easier backside FIB milling and superior thinning. Sometimes referred to as scorpion grids or scorpion tail grids, each grid can hold up to 8 lamellae. Grids are 3mm in diameter and ship in a Gel Box of 50 grids. 16560 FIB Lift Out Grids for Inverted Sample Prep, 3 posts, molybdenum, pkg 50
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